Annual regional technology and innovation event features the latest technologies in test, measurement and embedded systems
Jakarta (Antara Bali) -- National Instruments (Nasdaq: NATI), the provider of solutions that enable engineers and scientists to solve the world's greatest engineering challenges, hosted its annual NI Technical Symposium on 10 December, 2015, in Jakarta, Indonesia. Attended by engineers, educators and scientists, NI Technical Symposium 2015 featured technical content focusing on Embedded Systems, Automated Test and RF, and Measurements.
"Our customers are faced with the demand to create increasingly complex and intelligent engineering systems in the Industrial Internet of Things (IIoT) realm. From connected machines that drive greater efficiencies at factory floors or smart grids that deliver sustainable energy, National Instruments continues to demonstrate our commitment to support engineers and scientists in accelerating innovation and productivity with our platform-based approach," says Mr. Chandran Nair, Vice President for Asia Pacific, National Instruments.
NI Technical Symposium provides an opportunity for engineers, scientists and academics to network and connect with peers and domain experts from the industry and academia. In addition, NI partners and customers share cutting edge applications at an exhibition held concurrently with the conference.
During the conference, NI will also showcase an array of high-performance test applications, and a hardware and software boost to its existing line of instruments and automated test applications, including system design software LabVIEW 2015.
NI LabVIEW 2015 delivers marked speed improvements, development shortcuts and debugging tools to empower developers to efficiently interact with the systems they create. Through the reuse of the same code and engineering processes across systems, LabVIEW is set to accelerate engineering productivity with its impressive collection of features to help developers save time and money against the backdrop of technology advancement, evolving requirements, and increased time-to-market pressure.
To meet the evolving requirements of the IIoT, NI's platform brings together intelligent systems, connectivity and system-to-system communications, coupled with analytical software tools designed to deliver business insights and customer value. The new embedded systems hardware, based on the open, flexible LabVIEW reconfigurable I/O (RIO) architecture, includes the high-performance CompactRIO Controller for integrators with rugged, industrial applications, Controller for FlexRIO for designers with high-performance embedded applications and Single-Board RIO Controller for designers who require more flexibility in their embedded applications.
Another key solution is NI's new Wireless Test System (WTS), which dramatically lowers the cost of high-volume wireless manufacturing test. Although faced with the rising complexity of wireless test, companies can confidently reduce test costs and multiply throughput on the production floor with a system optimized for measurement speed and parallel test.
Finally, with the exponential growth of engineering data, smarter, software-based measurement systems help users embed intelligence and processing at the point of acquisition, capturing only the most necessary data. The new 4- and 8-slot CompactDAQ controllers feature Intel Atom quad-core 1.91 GHz E3845 processors, programmable with new LabVIEW 2015 system design software, so engineers and scientists can customize their data acquisition systems to add functionality like processing, intelligence and control.
COPYRIGHT © ANTARA News Bali 2015
Jakarta (Antara Bali) -- National Instruments (Nasdaq: NATI), the provider of solutions that enable engineers and scientists to solve the world's greatest engineering challenges, hosted its annual NI Technical Symposium on 10 December, 2015, in Jakarta, Indonesia. Attended by engineers, educators and scientists, NI Technical Symposium 2015 featured technical content focusing on Embedded Systems, Automated Test and RF, and Measurements.
"Our customers are faced with the demand to create increasingly complex and intelligent engineering systems in the Industrial Internet of Things (IIoT) realm. From connected machines that drive greater efficiencies at factory floors or smart grids that deliver sustainable energy, National Instruments continues to demonstrate our commitment to support engineers and scientists in accelerating innovation and productivity with our platform-based approach," says Mr. Chandran Nair, Vice President for Asia Pacific, National Instruments.
NI Technical Symposium provides an opportunity for engineers, scientists and academics to network and connect with peers and domain experts from the industry and academia. In addition, NI partners and customers share cutting edge applications at an exhibition held concurrently with the conference.
During the conference, NI will also showcase an array of high-performance test applications, and a hardware and software boost to its existing line of instruments and automated test applications, including system design software LabVIEW 2015.
NI LabVIEW 2015 delivers marked speed improvements, development shortcuts and debugging tools to empower developers to efficiently interact with the systems they create. Through the reuse of the same code and engineering processes across systems, LabVIEW is set to accelerate engineering productivity with its impressive collection of features to help developers save time and money against the backdrop of technology advancement, evolving requirements, and increased time-to-market pressure.
To meet the evolving requirements of the IIoT, NI's platform brings together intelligent systems, connectivity and system-to-system communications, coupled with analytical software tools designed to deliver business insights and customer value. The new embedded systems hardware, based on the open, flexible LabVIEW reconfigurable I/O (RIO) architecture, includes the high-performance CompactRIO Controller for integrators with rugged, industrial applications, Controller for FlexRIO for designers with high-performance embedded applications and Single-Board RIO Controller for designers who require more flexibility in their embedded applications.
Another key solution is NI's new Wireless Test System (WTS), which dramatically lowers the cost of high-volume wireless manufacturing test. Although faced with the rising complexity of wireless test, companies can confidently reduce test costs and multiply throughput on the production floor with a system optimized for measurement speed and parallel test.
Finally, with the exponential growth of engineering data, smarter, software-based measurement systems help users embed intelligence and processing at the point of acquisition, capturing only the most necessary data. The new 4- and 8-slot CompactDAQ controllers feature Intel Atom quad-core 1.91 GHz E3845 processors, programmable with new LabVIEW 2015 system design software, so engineers and scientists can customize their data acquisition systems to add functionality like processing, intelligence and control.
Editor : I Gusti Bagus Widyantara
COPYRIGHT © ANTARA News Bali 2015